China Atomic Force Microscope manufacturer
Truth Instruments Co., Ltd.
Empowering Scientific Innovation with Precision Measurement, Providing Reliable Equipment for Manufacturing Industry
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Truth Instruments Co., Ltd.

City: qingdao

Province/State:shandong

Country/Region:china

Tel:+86-532-89267428

Contact Person:
Mr.Alex TANG
View Contact Details
1 - 10 of 140 Selling leads
Product Introduction The AtomEdge Pro Multifunctional Atomic Force Microscope enables sub-nanometer-scale 3D scanning, imaging and characterization of ... 2026-04-17 00:41:42
Wafer-Level Hysteresis Loop Measurement Instrument Product Introduction Using polar/longitudinal magneto-optical Kerr effects (MOKE), this instrument ... 2026-04-17 00:41:42
Advanced AFM With Multiple Modes For Nanoscale Characterization Product Description: The Atomic Force Microscope is a cutting-edge instrument designed ... 2026-04-17 00:41:42
High Scanning Force Microscope For Wafe Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument used for high-resolution ... 2026-04-17 00:41:42
Multi Functional Atomic Force Microscope With MFM EFM PFM Modes Product Description: One of the key features of the AFM is its low noise levels in ... 2026-04-17 00:41:42
Advanced Atomic Force Microscope For High-Resolution Imaging Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high... 2026-04-17 00:41:42
Wafer-Level Atomic Force Microscope Product Model: Atommax Product Overview: Using micro-cantilever probe structures, this instrument enables 3D ... 2026-04-17 00:41:42
Multi-Functional Atomic Force Microscope Product Model: AtomEdge Pro Product Description: The AtomEdge Pro multi-functional atomic force microscope ... 2026-04-17 00:41:42
Product Description: The Cryogenic Probe Station is a state-of-the-art 0-67GHz microwave-compatible 4K cryogenic probe station designed to meet the ... 2026-02-10 20:54:29
Product Description: The PS-Cryo 4 K cryogenic probe station is a state-of-the-art multi-probe (4-8 arms) cryogenic optoelectronic and microwave probe ... 2026-02-10 20:54:28
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