Multi-Functional Atomic Force Microscope Product Model: AtomEdge Pro Product Description: The AtomEdge Pro multi-functional atomic force microscope
canperform three-dimensional scanning imaging on materials,
electronic devices, biological samples, etc. lt features multiple
working modes such as contact, tap, and non-contact, providing
users with more flexible and precise operation options. In
addition, it integrates multiple functional modes such as magnetic
force microscopy, electrostatic force microscopy, scanning Kelvin
microscopy, and piezoelectric force microscopy, featuring strong
stability and good scalability. In addition, functional modules can
be flexibly customized according to user needs, providing targeted
solutions for specific research fields and achieving an efficient
detection platform with multiple uses in one machine. Equipment Performance: | Sample Size | 25 mm | | Scanning Method | XYZ three-axis full sample scanning | | Scanning Range | 100 μm x100 μmx 10 μm | | Scanning Rate | 0.1-30 Hz | | Noise Level in The XY Direction | 0.4 nm | | Noise Level in The Z Direction | 0.04 nm | | Nonlinearity | 0.15% in the xY direction and 1% in the Z direction | | lmage Sampling Point | The maximum resolution of the scanning probe image is 4096x4096 | | Working Mode | Contact mode, tap mode, phase imaging mode, lift mode,
multi-directional scanning mode | Multifunctional
Measurement | Electrostatic force microscope (EFM), scanning Kelvin microscope
(KPFM), piezoelectric force micro-scope (PFM),magnetic force
microscope (MFM), force curve |
Application Cases: Strontium titanate (STO) - Scanning mode:Tap mode
- Scanningrange:4 um x4 μm
- Titanium Film - Aluminum Titanate Film
- Scanning Mode: Piezoresponse Force Microscopy (PFM)
- Scanning Range: 10 μmx10 μm
- Vanadium Sulfide Thin Film
- Scanning Mode: Electrostatic Force Microscopy (EFM)
- Scanning Range: 5 μm x 5 μm
- Vanadium Sulfide Thin Film
- Scanning Mode: Kelvin Probe Force Microscopy (KPFM)
- Scanning Range: 5 μm x 5 μm
- Maze domain andSkyrmions in mTJ stack:SAF/MgO/[Ta/Co/Pt]9
- Scanning Mode: Magnetic Force Microscopy (MFM)
- Scanning Range: 10 μm x 10 μm
- Co/Pt Thin Film
- Scanning Mode: Magnetic Force Microscopy (MFM)
- Scanning Range: 30 μm x 30 μm
- High Stationary phasepyrolytic graphite (HOPG)
- Scanning Mode: Tapping Mode
- Scanning Range: .45 um x 45 um
- Al₂O₃ Whisker Morphology
- Scanning Mode: Tapping Mode
- Scanning Range: 15 μm x 15 μm
- Epoxy Resin Polymer Morphology
- Scanning Mode: Tapping Mode
- Scanning Range: 7 μm x 7 μm
- Pt-Co Thin Film Magnetism
- Scanning Mode: MFM (Lift Mode)
- Scanning Range: 5 μm x 5 μm
- Lithium Niobate Thin Film
- Scanning Mode: Piezoresponse Force Microscopy (PFM)
- Scanning Range: 35 μm x 35 μm
- Bacillus Immobilis
- Scanning Mode: Topography Measurement
- Scanning Range: 3 μm x 3 μm
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