Wafer-Level Atomic Force Microscoperoscope
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Detailed Product Description
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Wafer-Level Atomic Force Microscope Product Model: Atommax Product Overview: Using micro-cantilever probe structures, this instrument enables 3D morphology characterization of conductive, semiconductive, and insulating solid materials, achieving wafer-level large-sample morphology characterization. Combined with an optical image, the electrically driven sample positioning stage allows for 1 μm positioning accuracy within a 200 x 200 mm area. with fully automated operations for laser alignment, probe approach, and scanning parameter adjust.ments. Equipment Performance Specifications
Application Cases
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| Product Tags: Wafer Level Atomic Force Microscopes Atomic Force Microscopes 0.1Hz 30Hz Probe Microscope |
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Wafer-Level Atomic Force Microscoperoscope |
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