Basic-type Atomic Force Microscope
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Product Name Basic-type Atomic Force Microscope - AtomExplorer Product Introduction The AtomExplorer Basic-type Atomic Force Microscope delivers sub-nanometer resolution for observing material surface topography and texture. It captures fine structures and minute features on material surfaces across scales from nanometers to micrometers, providing detailed visual information on material, chip and other sample surface topography. This product also integrates Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM), Kelvin Force Microscopy (KFM), and Atomic Force Microscopy (AFM). It offers high stability, excellent expandability, and customization services. As a high-precision topography characterization tool and a device for high-nanoscale magnetic and electrical measurements, it provides additional options and support for education, scientific research and industrial R&D. Equipment Performance
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Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization |
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0.1 Hz - 30 Hz Atomic Force Microscope 0.04 nm High Precision Microscope With Multiple Modes |
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High Scanning Force Microscope 0.15 nm High Resolution Microscope For Wafe |
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Multi Functional Atomic Force Microscope Low Noise Materials Microscope With MFM EFM PFM Modes |
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0.15 nm High Resolution Microscopes Customized Atomic Microscopes |
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Wafer-Level Atomic Force Microscoperoscope |