Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization
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Product Introduction The AtomEdge Pro Multifunctional Atomic Force Microscope enables sub-nanometer-scale 3D scanning, imaging and characterization of materials, electronic devices, biological samples, and other specimens, and is widely used in fields such as materials science, chemistry and environmental science, semiconductors, microelectronics, biomedicine, and more. Featuring multiple operating modes including contact, tapping, and non-contact, it offers users greater flexibility and precision in operation. Additionally, it integrates various techniques such as Magnetic Force Microscopy, Electrostatic Force Microscopy, Scanning Kelvin Microscopy, and Piezoelectric Force Microscopy, delivering robust stability and excellent expandability. Furthermore, functional modules can be flexibly customized to meet specific user requirements, delivering tailored solutions to particular research fields and creating a highly efficient, multi-purpose inspection platform. Equipment Performance
Multifunctional Measurements Electrostatic Force Microscope (EFM), Scanning Kelvin Microscope (KPFM), Piezoelectric Force Microscope (PFM), Scanning Capacitive Atomic Force Microscope (Scm), Magnetic Force Microscope (MFM); Optional: Conductive Atomic Force Microscope (C-AFM) Applications Strontium titanate(STO) Tap mode Maze Domain and Skyrmions in mTJ Stack:SAF/MgO/Ta/Co/Pt)₉ Magnetic Force Microscope(MFM) Bismuth vanadate thin filmScanning Kelvin Microscope(KPFM) Perovskite (FAPbI₃) Conductive Atomic ForceMicroscope (C-AFM) |
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| Product Tags: Low-noise Z-axis atomic force microscope High-precision nanoscale materials characterization Z-axis for AFM nanoscale analysis |
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Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization |
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0.1 Hz - 30 Hz Atomic Force Microscope 0.04 nm High Precision Microscope With Multiple Modes |
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High Scanning Force Microscope 0.15 nm High Resolution Microscope For Wafe |
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Multi Functional Atomic Force Microscope Low Noise Materials Microscope With MFM EFM PFM Modes |
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0.15 nm High Resolution Microscopes Customized Atomic Microscopes |
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Wafer-Level Atomic Force Microscoperoscope |