Product Description:
One of the key features of the AFM is its low noise levels in both
the Z direction and XY direction, ensuring accurate and reliable
measurements. The noise level in the Z direction is an impressive
0.04 nm, providing exceptional sensitivity for capturing subtle
surface variations and interactions. In the XY direction, the noise
level is maintained at 0.4 nm, further enhancing the precision
of the imaging and scanning process.
The AFM offers a generous sample size capacity of 25 mm,
accommodating a wide range of samples for analysis. Its versatile
scanning method utilizes XYZ three-axis full sample scanning,
allowing for comprehensive measurements and analysis of the sample
surface. The scanning range of the AFM is extensive, covering 100
μm x 100 μm x 10 μm, enabling detailed imaging and mapping of
nanostructures and surface features.
Researchers and scientists can benefit greatly from the AFM's
capabilities in nanoscale electrical measurement, which enables the
characterization of electrical properties at the nanometer scale.
The Electrostatic Force Microscopy feature of the AFM allows for
the investigation of surface charge distribution and electrostatic
interactions, providing valuable insights into the behavior of
materials at the atomic level.
In conclusion, the Atomic Force Microscope is a sophisticated
instrument that offers unparalleled precision, sensitivity, and
versatility for nanoscale imaging and measurements. With its
advanced features, low noise levels, and comprehensive scanning
capabilities, the AFM is an indispensable tool for scientific
research and exploration in various disciplines.
Features:
- Product Name: Atomic Force Microscope
- Nonlinearity: 0.02% In The XY Direction And 0.08% In The Z
Direction
- Scanning Rate: 0.1-30 Hz
- Sample Size: 25 mm
- Noise Level in The Z Direction: 0.04 nm
- Scanning Method: XYZ Three-axis Full Sample Scanning
Technical Parameters:
| Sample Size | 25 mm |
| Scanning Rate | 0.1-30 Hz |
| Scanning Range | 100 μm x 100 μm x 10 μm |
| Nonlinearity | 0.02% in the XY direction and 0.08% in the Z direction |
| Noise Level in the Z Direction | 0.04 nm |
| Scanning Method | XYZ Three-axis Full Sample Scanning |
| Noise Level in the XY Direction | 0.4 nm |
Applications:
One of the key application occasions for the AtomEdge Pro is in surface analysis . Researchers and scientists can utilize this AFM to
investigate the topography and properties of a wide range of
surfaces at the nanoscale level. The instrument's noise levels in
the Z direction, measuring 0.04 nm, ensure accurate and
reliable measurements, making it ideal for surface roughness
analysis and characterization.
Another important scenario for using the AtomEdge Pro is in materials science research. The scanning range of 100 μm X 100 μm x 10 μm, coupled
with a noise level of 0.4 nm in the XY direction, enables detailed
examination of material properties at the nanoscale. Whether
studying thin films, polymers, or composites, this AFM provides
valuable insights into material composition and structure.
Moreover, the AtomEdge Pro's scanning method, utilizing XYZ
three-axis full sample scanning, offers flexibility and precision
in imaging various samples. Researchers can explore nanomaterials , biological samples, and semiconductor devices with ease, thanks
to the instrument's scanning rate of 0.1-30 Hz.
In academia, the AtomEdge Pro serves as an indispensable tool for nanotechnology research, allowing scientists to delve into the intricate world of
nanomaterials and nanostructures. Its advanced capabilities and
user-friendly interface make it a preferred choice for studying
nanoscale phenomena and conducting experiments with high precision.
