China Laboratory Test Equipment manufacturer
shanghai kerang technology co ltd
Shanghai kerang technology co ltd
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test finger probe

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Test Probe with Force HT-I20 & HT-I21 Standard:IEC60884-1 figure 9 and figure 10. Application:The HT-I20 test probe with 20N force is used to test ... 2024-12-09 20:48:22
Probe for Film-Coated Wire HT-U03 Standard:UL398 Fig 8.2(PA170B),UL507(PA170D),UL749 Fig 2,UL982 Fig 58.6 and UL1278 Fig 8.2(PA140A). Application:It ... 2024-12-09 20:48:22
UL Probe for Uninsulated Live Parts HT-U02 Standard: UL507-2006(PA135A)Fig 9.1, UL749 Fig 1, UL982 Fig 58.6 and UL1278 Fig 8.1(PA130A). Application:It ... 2024-12-09 20:48:22
Adult Arm Probe HT-I37 Standard:EN 50636-2-100 figure 2 and EN13683-2003:clause 5.2.1.3 figure 5 Application: It is used to simulate the adult to test ... 2024-12-09 20:48:22
Young Adult Arm Probe HT-I36 Standard:EN 50636-2-100 figure 1 and IEC 50636-2. Application:It is used to simulate the young adult to test whether the ... 2024-12-09 20:48:22
Thrust Rod HT-I35 Standard:IEC60884.1-2002 and IEC60950.1-2005. Application:Thrust test. Test sample: - Feature:- Parameters: Model HT-I35 HT-I35A End ... 2024-12-09 20:48:22
The Scratched Pin HT-I34 Standard:IEC60335-1 clause 21 and IEC60950-1. Application:The test pin is used to do the scratch resistant test of the ... 2024-12-09 20:48:22
Test Probe HT-I33 Standard:IEC60335-2-14. Application:The stirrer shall incorporate a biased-off switch that is recessed or guarded to prevent ... 2024-12-09 20:48:22
Surface Temperature Probe HT-I32 Standard:IEC60335-2-11 figure 101 and IEC60335-2-6-2002 figure 104. Application:It is mainly used to measure the ... 2024-12-09 20:48:22
Small Test Pin Probe HT-I30 Standard:BS1363.1 clause 12.6.1 figure 1 and IEC 60065. Application:It is used to test for the electronic equipment to see ... 2024-12-09 20:48:22
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