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2SC2482 TO-92 Plastic Package Transistors ( NPN ) , General Purpose Npn Transistor

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City: shenzhen

Country/Region:china

Tel:86-755-88367702

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Ms.Doris Guo
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2SC2482 TO-92 Plastic Package Transistors ( NPN ) , General Purpose Npn Transistor

Model Number 2SC2482
Certification new & original
Place of Origin original factory
Minimum Order Quantity 10pcs
Price Negotiate
Payment Terms T/T, Western Union, Paypal
Supply Ability 8900pcs
Delivery Time 1 day
Packaging Details Please contact me for details
Description Bipolar (BJT) Transistor NPN 300 V 100 mA 50MHz 900 mW Through Hole TO-92MOD
Collector-base voltage 300 V
Collector-emitter voltage 300 V
Emitter-base voltage 7 V
Collector current 100 mA
Base current 50 mA
Junction temperature 150 °C
Detailed Product Description

 

Silicon NPN Epitaxial Type (PCT Process)  2SC2482

 

High-Voltage Switching and Amplifier Applications

Color TV Horizontal Driver Applications

Color TV Chroma Output Applications

 

• High breakdown voltage: VCEO = 300 V

• Small collector output capacitance: Cob = 3.0 pF (typ.)

• Recommended for chroma output and driver applications for line-operated TV horizontal.

 

Absolute Maximum Ratings (Ta = 25°C)

CharacteristicsSymbolRatingUnit
Collector-base voltageVCBO300V
Collector-emitter voltageVCEO300V
Emitter-base voltageVEBO7V
Collector currentIC100mA
Base currentIB50mA
Collector power dissipationPC900mW
Junction temperatureTj150°C
Storage temperature rangeTstg−55 to 150°C

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).

 

 

 

 

 

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