71 - 80 of 127
optical semiconductor inspection system
Selling leads|
M20EL Series Mini LED luminescence inspection Model M2012EL Inspection Inspection items Bad die, over luminescence, under luminescence, chroma anomaly ...
2026-04-19 00:34:50
|
|
... inspection M2025 Inspection Inspection items Missed bonding, wrong bonding, die damaged, die offset, die tilted, die flipped, wrong polarity, ...
2026-04-19 00:34:50
|
|
Down-illuminated AOI 1. High detection, low misjudgment 2. Unique chain track 3. Rich detection algorithms can effectively target DIP defects 4. Two...
2026-04-19 00:34:50
|
|
... at products) 4. Independently developed optical system (light source consistency) 5. High stability integrated casting platform Application scope: ...
2026-04-19 00:34:50
|
|
... at products) 4. Independently developed optical system (light source consistency) 5. High stability integrated casting platform Application scope: ...
2026-04-19 00:34:50
|
|
... at products) 4. Independently developed optical system (light source consistency) 5. High stability integrated casting platform Application scope: ...
2026-04-19 00:34:50
|
|
... at products) 4. Independently developed optical system (light source consistency) 5. High stability integrated casting platform Application scope: ...
2026-04-19 00:34:50
|
|
... at products) 4. Independently developed optical system (light source consistency) 5. High stability integrated casting platform Application scope: ...
2026-04-19 00:34:50
|
|
... at products) 4. Independently developed optical system (light source consistency) 5. High stability integrated casting platform Application scope: ...
2026-04-19 00:34:50
|
|
...Optical Inspection Online Single-Track Model K2005 Testing Capability Test items CHIP component body, CHIP component solder joints, characters, DIP ...
2026-04-19 00:34:50
|
