High Speed Double Laser Micrometer Measurement For Diameter And Defect
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Good at Vibrating object measurement , restore object actual statusF2010-k is a high-speed optical laser micrometer based on laser diffraction principle. It is fast enough to provide diameter, lumps and necks measurement in 2-axis. Sampling frequency can reach to 10KHz due to no motor running speed
limitation,which enables to get more information of the object
under measurement. Single axis sampling frequency of 10 KHzSampling frequency can reach to 10KHz due to no motor running speed limitation,which enables to get more information of the object under measurement. Extremely short exposure time of 0.5usFeaturing an incredibly short exposure time, F2010-k is good at
capturing object images without any blur or shadow, ensuring
precise measurement accuracy.
Applications
Touch Screen,Computer,CellphoneDALA F2010-K can be managed by computer ,cellphone and Touch screen,like parameter setting ,measurement data management , and so on,customers can choose as their application request. Technical Specification
Note: (1) set sliding window as 100ms, outside diameter repeatability of φ1mm round rod at measurement center area (2) set sliding window as 100ms, outside diameter deviation of φ1mm round rod at measurement area (3)set defect measurement average time as 0ms, the minimum defect length which cannot be missed at the measurable area (4)PI feedback control is option, but must order at placing order
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| Product Tags: High Speed double laser micrometer double laser micrometer Diameter High Speed laser micrometer measurement |
