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High Speed Rotating Scanner And Probe Portable Eddy Current Flaw Detector

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Suzhou Desisen(DSS) Electronics Co.,Ltd

City: suzhou

Province/State:jiangsu

Country/Region:china

Tel:86-0512-63419655

Contact Person:
Miss.Chin View Contact Details

High Speed Rotating Scanner And Probe Portable Eddy Current Flaw Detector

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Brand Name Suzhou Desisen (DSS) Electronics
Model Number FET-5.01
Certification ISO 9001, CE
Place of Origin China
Minimum Order Quantity 1 set
Price USD $8999-9999
Payment Terms L/C,D/A,D/P,T/T,Western Union,MoneyGram
Supply Ability 100 sets
Delivery Time 10-20days
Packaging Details wooden case
Number of channels 1–4 channels
Number of generators 1 (with built-in electronic reference)
Maximum voltage 12 Vp-p, 10 Ω
Operating frequency 20 Hz to 6 MHz
Detailed Product Description

Product Description:

Eddy Current Testing (ECT) is a non-contact testing technology used for metal components. Under the excitation of alternating current, the probe induces eddy currents in the tested component. Any discontinuity or change in material properties that can alter the eddy currents will be detected by the probe and regarded as potential defects. Over the years, probe technology and data processing have made continuous progress, and now eddy current technology is recognized as a fast, simple and accurate technology. This is why eddy current technology is widely used in industrial sectors such as aviation, automobile, petrochemical and electric power production to detect surface or near-surface defects in materials such as aluminum, stainless steel, copper, titanium, brass, chrome-nickel alloy and even carbon steel.

Features:

Functional Features:
• A fast, simple and reliable testing technology for detecting surface or near-surface defects in conductive materials.
• Uses high-speed rotating scanners and probes to inspect workpieces.


Eddy Current Probes
Olympus NDT standard eddy current probes are available in the following types:
• Bolt hole probes
• Surface probes of various shapes and configurations
• Low-frequency Spot and Ring probes
• Sliding probes
• Wheel probes
• Custom-made probes for special applications


The shape of the probe used in eddy current testing can be varied to better suit specific applications.
a- At a selected frequency, the alternating current passing through the probe generates a magnetic field around the probe.
b- When the coil is close to a conductive material, induced eddy currents are generated in the material.
c- If defects in the conductive material interfere with the flow of eddy currents, the magnetic coupling of the probe will change, and the defect signal can be interpreted by measuring the impedance change of the coil.


Eddy Current Software
Impedance plane graph and strip chart display
• Users can select the duration of the screen display.
• The reference signal overlay can be kept on the screen for easy signal interpretation.
• In freeze mode, signals can be rotated or gain adjusted without having to keep the probe fixed on the workpiece all the time.
• Zoom and optimal page display adjustment functions.
• Can connect to various scanners.
• With impedance plane graph, strip chart or real-time AC scan imaging display.


Multi-frequency operation and automatic mixing capability
• Operation with up to 8 frequencies (1 channel: 8 frequencies; 2 channels: 4 frequencies; 4 channels: 2 frequencies)
• Automatic mixing capability


Advanced real-time data processing
• 3 alarms that can be defined into different shapes, which can activate indicator lights, buzzers or TTL outputs.
• High-pass, low-pass and dedicated filters (with IIR and FIR filtering functions).


Alarms
• The entire range of user-selectable alarms (sector, rectangle, ring).
• Simple and quick to set up.
• Alarm outputs can be fully controlled.


Eddy Current Reports
• Report creation is simple and quick.
• The HTML report format is highly flexible, can be quickly sent via email, and can be viewed on any web browser.
• Predefined and user-customized reports.


Technical Parameters:

NameFET-5.01 Multi-Frequency Eddy Current Flaw Detector 
Bandwidth8 Hz to 5 kHz (in a single coil). The bandwidth is inversely proportional to the gap 
Number of receivers 1–4 receivers
Maximum input signal1 Vp-p  
Gain28 dB to 68 dB
Digitalization frequency40 MHz
Sampling rate1 Hz to 15 kHz (in a single coil). The rate may be limited by the instrument's processing capability
A/D resolution16 bits  
Phase rotation0° to 359°, with a step size of 0.1°
FilteringFIR low-pass, FIR high-pass, FIR band-pass, FIR band-stop 
Data storageMaximum file capacity depends on internal flash memory size: 180 MB (or 300 MB, optional)
 

Support and Services:

Technical Support and Service for Portable Eddy Current Flaw Detector

We provide technical support and service to ensure our customers are satisfied with their Portable Eddy Current Flaw Detector. We offer both on-site and online support for all of our products.

On-site Support

Our on-site support team is available to help with any installation, troubleshooting, or maintenance related issues you may have with your Portable Eddy Current Flaw Detector. Our technicians can come to your location and help with any questions or problems you may have.

Online Support

Our online support team is available 24/7 to help with any questions or issues you may have with your Portable Eddy Current Flaw Detector. We have a live chat feature on our website, as well as an online ticket system for more in-depth issues. Our team is always available to help.

 

FAQ:

Q1: What is the brand name of this product?

A1: The brand name of this product is Desisen.

Q2: What is the model number of this product?

A2: The model number of this product is FET-5.01 Eddy Current Flaw Detector.

Q3: Where is this product made?

A3: This product is made in China.

Q4: Does this product have any certification?

A4: Yes, this product has ISO9001 certification.

Q5: What's the minimum order quantity?

A5: The minimum order quantity is 1.
Product Tags: High Speed Eddy Current Flaw Detector   Probe Eddy Current Flaw Detector   Portable Eddy Current Flaw Detector  
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