China Compound Optical Microscope manufacturer
Opto-Edu (Beijing) Co., Ltd.
Opto-Edu (Beijing) Co., Ltd.
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scanning microscope

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Specification A63.7140 A63.7160 Key Parameters Resolution 1.4nm@15kV(SE) 2.5nm@30.0kV(BSE) 0.9nm@30kV(SE) 1.2nm@15kV(SE) 1.5nm@1kV(SE, BD mode) ... 2025-05-08 05:32:28
Magnification 360000x, Resolution 4nm@20KV(SE) With Detector SE+BSE+CCD, Optional EDS Standard X/Y Motorized Working Stage, Optional Five Axes X/Y/Z/R... 2025-03-22 07:39:34
▶ Laser Light 405nm/50mW, 488nm/50mW, 561nm/50mW, 640nm/40mW ▶ Confocal Scan Module X/Y dual axis high speed optical scanning, resolution 4Kx4K, field ... 2025-02-10 21:21:04
Schottky Field Emission Gun Scanning Electron Microscope, SE+CCD, 1x~2000000x 1x~2000000x With Detector SEx2+BSE+CCD, Extention Port For EDS, EBSD, CL ... 2024-12-09 23:06:08
▶ A64.5401 Features 1) The measurement and analysis software with integrated operation does not need to switch the interface for operation, and the ... 2024-12-09 22:08:10
Plane Scanning Atomic Force Microscope Gantry scanning head design, marble base, vacuum adsorption stage, sample size and weight are basically ... 2024-12-09 20:58:54
Probe Scanning Atomic Force Microscope Gantry scanning head design, marble base, vacuum adsorption stage, sample size and weight are basically ... 2024-12-09 20:58:54
Optical + Atomic Force Microscope, All-in-One ◆ Integrated design of optical metallographic microscope and atomic force microscope, powerful functions ... 2024-12-09 20:58:54
Research Level Atomic Force Microscope Research Level, Combined controller & main body design, with Contact Mode, Tapping Mode, 10x Objective. ... 2024-12-09 20:58:54
Basic Level Atomic Force Microscope Basic Level, Separate controller & main body design, with Contact Mode, Tapping Mode, 4x Objective The scanning ... 2024-12-09 20:58:54
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