OPTO-EDU A63.7190 300000x Critical Dimension Scanning Electron Microscope
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OPTO-EDU A63.7190 300000x Critical Dimension Scanning Electron MicroscopeCompatible With 6/8 Inch Wafers Size, Magnification 1000x-300000x Resolution 2.5nm (Acc=800V), Accelerating Voltages 500V--1600V Repeatability Static ... |
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