ISO 7765 ASTM D1709 Thin Film Falling Dart Impact Tester
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Detailed Product Description
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ISO 7765 ASTM D1709 Thin Film Falling Dart Impact Tester This precision testing instrument evaluates the impact resistance
performance of thin film materials using free-falling dart cascade
methods, compliant with international standards including GB/T
9639.1-2008 Method A and ISO 7765-88 requirements. Product Overview The Thin Film Falling Dart Impact Tester is engineered to determine
the impact resistance of plastic films and thin wafers through
controlled free-fall impact testing. Application Scope This instrument is suitable for testing plastic films and wafers
with thickness less than 1 mm, capable of measuring breakthrough
quality for materials weighing 0.05 to 2 kg. Testing Principle Using either Method A or Method B, the instrument determines the
falling mass quantity that causes 50% sample damage under specified
test conditions. Technical Specifications
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| Product Tags: ASTM D1709 Falling Dart Impact Tester Thin Film Falling Dart Impact Tester ISO 7765 Falling Dart Impact Tester |
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