Circuit Breaker Test Equipment with 3 Test Stations And 1A–1800 A Output Current
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IEC 60898-1 Circuit Breaker Time-Current Characteristics Test Equipment Product information: This equipment is designed and manufactured according to the technical requirements provided by the customer. It complies with the national standards IEC 60898-1 2003 clause 9.10.1, EN 60898-1 2003 clause 9.10.1. It is capable of performing time-delay tripping characteristic tests by applying 1.13 and 1.45 times the rated current to check whether the breaker trips within the specified time. The equipment is suitable for factory inspection of molded-case circuit breakers (MCCB) and air circuit breakers (ACB). It is an essential device for electrical performance testing for circuit breaker manufacturers. The test equipment features quick product loading, automatic testing, and automatic judgment functions.
The main body of the equipment is constructed with high-quality aluminum alloy steel. The panels are coated with anti-static, anti-rust, and corrosion-resistant finishes. The upper part of the equipment is equipped with an operation panel, power switch, and multiple wire terminals for time-delay tripping tests. The design is reasonable, convenient to use, easy to operate, reliable in performance, and aesthetically pleasing.
Working Principle: This test equipment adopts a low-voltage, high-current output principle. A high-current isolation transformer inside the machine outputs the required current. Through the touch screen, the operator sets the target current value, and the constant-current source adjusts the primary input voltage of the transformer to achieve automatic current stabilization. The touch screen also allows setting the test duration and comparing it with the actual tripping time, enabling automatic determination of whether the circuit breaker passes or fails.
Technical parameters:
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| Product Tags: 3 Test Stations Circuit Breaker Test Equipment 1A–1800 A Output Current Time-Current Characteristics Tester Sine Wave Output IEC 60898-1 Test Device | ||||||||||||||||||||||||
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