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HJ AUTOMATIC CONTROL TECHNOLOGY CO., LTD
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IEC 61032 Test Probe B

IEC 61032 Test Probe B

Brand Name HJ
Model Number HT-I02
Certification calibration certificate (cost additional)
Place of Origin China
Minimum Order Quantity 1 set
Price Negotiatable
Payment Terms T/T, L/C
Supply Ability 30 sets / per month
Delivery Time 3 days
Packaging Details Cartoon Box
Product name Test Finger Probe B HT-I02
Usage Access probes of IEC 60529 (IP code)
Probe code B, Test Finger Probe
Description Jointed test finger
Standard IEC 61032, IEC 60529-1, IEC 60335-1
Material Nylon handle + stainless steel finger
Finger length 80mm
Baffle diameter Ф75mm
Detailed Product Description

IEC61032 Test Finger Probe Figure 2 Test Probe B 80mm Finger Length

 

Standard:

IEC 61032 ‘Protection of persons and equipment by enclosures – Probes for verification’ figure 2 test probe B.

IEC 60529 Degrees of protection provided by enclosures (IP Code) IP2X

IEC 60335-1 ‘Household and similar electrical appliances – Safety – Part 1: General requirements’

 

Application:

This probe is intended to verify the basic protection against access to hazardous parts. It is also used to verify the protection against access with a finger.

Access probes of IEC 60529 (IP code) to verify protection of persons against access to hazardous live parts or hazardous mechanical parts.

 

Feature:

It has two movable joints, which can be curved at 90°. Can be used with a electrical indicator.

A hole (M6) can be made at the end of the handle for connection with a push-pull gauge. The model with ‘T’ means that this model is with force.

 

Parameter:

ModelHT-I02HT-I02AHT-I02BHT-I02T
Name

Standard Test Finger

Test Finger Probe

Circular Baffle Test fingerLarge Baffle Test FingerStandard Test Finger With Force
Joint 130±0.230±0.230±0.230±0.2
Joint 260±0.260±0.260±0.260±0.2
Finger length80±0.280±0.2100±0.280±0.2
Fingertip to baffle180±0.2180±0.2----180±0.2
CylindricalR2±0.05R2±0.05R2±0.05R2±0.05
SphericalR4±0.05R4±0.05R4±0.05R4±0.05
Fingertip cutting bevel angle37o 0 -10′37o 0 -10′37o 0 -10′37o 0 -10′
Fingertip taper14 o 0 -10′14 o 0 -10′14 o 0 -10′14 o 0 -10′
Test finger diameterФ12 0 -0.05Ф12 0 -0.05Ф12 0 -0.05Ф12 0 -0.05
A-A Section diameterФ50Ф50----Ф50
A-A Section width20±0.2--------20±0.2
Baffle diameterФ75±0.2Ф75±0.2Ф125±0.2Ф75±0.2
Baffle thickness5±0.55±0.5----5±0.5
Force------------With force 0-50N
Applied standardIEC61032-1IEC60335-1IEC60335-2-14IEC60529-1

 

                                 

Product Tags: IEC 61032 Test Probe B   IEC 61032 Probe B   Test Probe B IEC 61032  
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