IEC 60529 Jointed Test Finger Probe Stainless Steel With 50N Force
|
Detailed Product Description
|
Test Finger Probe Access Probes of IEC 60529 Jointed Test Finger With 50N Force
Standard: IEC 60529 Degrees of protection provided by enclosures (IP Code) Figure 1 – Jointed test finger. IEC 61032 Protection of persons and equipment by enclosures –Probes for verification Figure 2–Test probe B. And other standard such as IEC 60335-1, IEC60884-1, IEC 60598-1, IEC60065-1, IEC 62368-1 and etc.
Application: It is used to verify protection of persons against access to hazardous live parts or hazardous mechanical parts. Test Finger Probe
Parameter:
|
|||||||||||||||||||||||||||||||||||||||||||||||||||
| Product Tags: IEC 60529 Test Finger Probe 50N Test Finger Probe |
Related Products
|
IEC 60335 Test Finger Nail Probe |
|
Ф8.6 Children Test Finger Probe 18 |
|
IEC 61032 Test Probe B |
|
IEC60065 Short Test Pin Probe HT-I09 IEC61032 Figure 9 Test Probe 13 Metal Pin Tip Diameter Ф3 |
|
IEC61032 Children Finger Probe 18 HT-I12 Hemispherical R4.3±0.05 Finger Probe Diameter Ф8.6±0.1 |
|
25mm Cone Shaped Articulated Test Finger Probe Hand 10.5 – 11.5 Year Age |
Email to this supplier