AL-27min Desktop X Ray Diffractometer XRD Analysis Testing
EquipmentDescription Designed for industrial production and quality control, this
advanced technology of concentrated X-ray diffraction instrument
enables functional and miniaturized benchtop X-ray diffraction
equipment. It can precisely conduct qualitative analysis,
quantitative analysis and crystal structure analysis on metal and
non-metal samples. It is particularly suitable for the
manufacturing industries of catalysts, titanium dioxide, cement,
pharmaceuticals, etc.
Technical Parameter Operating Power (Tube Voltage, Tube Current) | 600W (40kV, 15mA) or 1200W (40kV, 30mA); Stability: 0.005% | X-ray Tube | Metal-ceramic X-ray tube, Cu target, power 2.4kW, focal spot size:
1x10 mm; Cooling method: air-cooled or water-cooled (water flow
rate > 2.5L/min) | Goniometer | Sample horizontal θs-θd structure, diffraction circle radius 150mm | Sample Measurement Modes | Continuous, Stepwise, Omg | Angle Measurement Range | -3° - 150° when θs/θd are linked | Minimum Step Width | 0.0001° | Angle Reproducibility | 0.0005° | Angle Positioning Speed | 1500°/min | Counter | Sealed proportional counter or high-speed one-dimensional
semiconductor counter | Energy Spectrum Resolution | Less than 25% | Maximum Linear Count Rate | ≥5×10⁵ CPS (proportional counter); ≥9×10⁷ CPS (one-dimensional
semiconductor counter) | Instrument Control Software | Windows 7 operating system; Automatically controls the tube
voltage, tube current, shutter and X-ray tube aging training of the
X-ray generator; Controls the goniometer for continuous or step
scanning while collecting diffraction data; Performs routine
processing of diffraction data: automatic peak searching, manual
peak searching, integral intensity, peak height, center of gravity,
background subtraction, smoothing, peak shape magnification,
spectrum comparison, etc. | Data Processing Software | Functions include phase qualitative and quantitative analysis, Kα1
and α2 stripping, full spectrum fitting, selected peak fitting,
calculation of full width at half maximum (FWHM) and grain size,
unit cell determination, type II stress calculation, diffraction
line indexing, multiple plotting, 3D plotting, diffraction data
calibration, background subtraction, standardless quantitative
analysis, full pattern fitting (WPF), XRD diffraction spectrum
simulation, etc. | Scattered Radiation Protection | Lead + lead glass protection; Interlock between shutter window and
protective device; Scattered radiation dose ≤1μSv/h | Comprehensive Stability of the Instrument | ≤1‰ | Sample Loading Capacity at One Time | Equipped with a sample changer, capable of loading up to 6 samples
at a time | Instrument Overall Dimensions | 600×410×670 (w×d×h) mm |
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