Desktop Diffraction Instrument High Quality Benchtop XRD
Diffractometer Machine 1.Product Introduction Designed for industrial production and quality control, advanced
technology for the production of concentrated X-ray
diffractometers, functional and miniaturized benchtop X-ray
diffractometers. It can precisely conduct qualitative analysis,
quantitative analysis and crystal structure analysis on both metal
and non-metal samples. It is especially suitable for the
manufacturing industries of products such as catalysts, titanium
dioxide, cement, and pharmaceuticals.
2.Product Parameter Operating power | 600W(40kV, 15mA) or 1600W(40kV, 40mA), stability: < 0.005% | X-ray tube | Metal ceramic X-ray tube, Cu target, power 2.4KW, focus size: 1×10mm, air-cooled or water-cooled (water flow rate greater than
2.5L/min) | Goniometer | Sample level Optical coding technology and servo motors are adopted
to drive the rotation of θs and θd | Measurement method | Continuous, step-by-step, Omg | Angle measurement range | - 3 °- 150 ° | Minimum step width | 0.0001 ° | Angle reproduction | 0.0005 ° | Angular positioning speed | 1500°/min | Detector | Digital pulse processing counting or semiconductor array detector | Counting throughput | 1×107CPS, 9×107CPS | Energy spectrum resolution | ≤25% or ≤1keV | Computer | Business notebook | Instrument control software | Windows10 operating system, automatically controls the tube
voltage, tube current, photoswitch and X-ray tube aging training of
the X-ray generator. Control the goniometer to scan continuously or
step by step, and simultaneously collect diffraction data.
Conventional processing of diffraction data: automatic peak
finding, manual bee finding, integration intensity, peak height,
center of gravity, background subtraction, smoothing, peak shape
magnification, spectrum comparison, etc. | Data processing software | Phase qualitative analysis, fixed-position analysis, Kα1, α2 exfoliation, full spectrum fitting, peak selection fitting,
half-height width and grain size calculation, unit cell
determination, Class II stress calculation, diffraction line
indexing, multiple plotting, 3D plotting, diffraction data
calibration, background subtraction, quantitative analysis without
calibration, full spectrum fitting (WPF), XRD diffraction spectrum
simulation and other functions. | Scattered line protection | Lead + lead-glass protection, the light gate window is connected to the protective
device, and the scattering line is calculated not more than 1μSv/h | Comprehensive stability of the instrument | ≤0.5% | One-time softening data of the sample | Configure the sample changer, with a maximum of 6 samples loaded
each time | Instrument external dimensions | 580×450×680(L×W×H)mm |
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