Comprehensive Flash Memory Test System High And Low Temperature Accelerated Aging Chamber

product Specification

Flash memory chip intelligent test system HD-512-NAND is a comprehensive flash memory test system that can customize the test plan and support parallel testing of various types of flash memory particles. 64 types, the maximum number of flash memory particles in parallel testing can reach 512.

Flash memory chip intelligent test system YC-512-NAND supports multiple test patterns and custom test parameter functions, and can provide one-click basic test process and high-level test process with high flexibility, not only can realize the remaining life of flash memory particles, actual measurement , data retention and read interference and other functional tests can also help users verify the reliability status of flash memory particles. After the test is completed, the test report can be easily and quickly exported with one key, providing customers with the most intuitive and accurate graphical test data. Provide the most intuitive data reference for the grade classification and application of flash memory particles, and realize intelligent classification based on the quality inspection results of flash memory particles.

※ The test basis complies with JEDEC Stand No.218: Solid State Technology Association B-2016 Solid-State Drive(SSD) Requirements And Endurance Test Motho;

※ The test basis complies with JEDEC Standard No.47 NVCE: Solid State Technology Association Stress-Test-Driven Qualification of Integrated Circuits;

※ The design specifications of the test board meet the requirements of the industrial-grade test temperature environment;