Flash Memory IC Chip MT4LC4M16R6TG-5 - Micron Technology - DRAM

Quick Detail:

DRAM

Description:

The 4 Meg x 16 DRAM is a high-speed CMOS, dynamic random-access memory device containing 67,108,864 bits and designed to operate from 3V to 3.6V. The device is functionally organized as 4,194,304 locations containing 16 bits each. The 4,194,304 memory locations are arranged in 4,096 rows by 1,024 columns on the MT4LC4M16R6 or 8,192 rows by 512 columns on the MT4LC4M16N3. During READ or WRITE cycles, each location is uniquely addressed via the address bits: 12 row-address bits (A0-A11) and 10 column-address bits (A0-A9) on the MT4LC4M16R6 or 13 row-address bits (A0-A12) and 9 column-address bits (A0-A8) on the MT4LC4M16N3 version. In addition, both byte and word accesses are supported via the two

CAS# pins (CASL# and CASH#).

The CAS# functionality and timing related to address and control functions (e.g., latching column addresses or selecting CBR REFRESH) is such that the internal CAS# signal is determined by the first external

CAS# signal (CASL# or CASH#) to transition LOW and the last to transition back HIGH. The CAS# functionality and timing related to driving or latching data is such that each CAS# signal independently controls the associated eight DQ pins.

The row address is latched by the RAS# signal, then the column address is latched by CAS#. This device provides EDO-PAGE-MODE operation, allowing for fast successive data operations (READ, WRITE or READMODIFY-WRITE) within a given row.

The 4 Meg x 16 DRAM must be refreshed periodically in order to retain stored data.

Applications:

• Single +3.3V ±0.3V power supply

• Industry-standard x16 pinout, timing, functions, and package

• 12 row, 10 column addresses (R6) 13 row, 9 column addresses (N3)

• High-performance CMOS silicon-gate process

• All inputs, outputs and clocks are LVTTL-compatible

• Extended Data-Out (EDO) PAGE MODE access

• 4,096-cycle CAS#-BEFORE-RAS# (CBR) REFRESH distributed across 64ms

• Optional self refresh (S) for low-power data retention

Specifications:

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