- 1x-500x Optical, 500x-800000x STEM, High Resolution 1.0nm@50kV,
Support BF/DF
- Brand New Design 5 Samples Loading System, One Set Up Applied To
All Samples Easily
- Ultra High-Speed Image Acquisition 100MB/s, Single 24k x 24k Image
Captuer In 6.5s
- Scan & Stitch Full FOV Large Image, Independent Operation of
Large Field and High-Resolution Imaging
- AI Micro-Particle Imaging Analysis Software Support Ultra Large FOV
100um@25nm, High Efficiency Recognition & Measure
Rapid Automatic Micro-Particle Imaging Analysis System A63.7230 is a fast, intelligent, fully automated scanning
transmission electron microscope (STEM) with complete independent
intellectual property rights at 50KV. It meets the application
needs in fields such as virus morphology observation, vaccine cell
bank safety testing, vaccine research and manufacturing, clinical
pathological tissue slice research, and biological research on
brain neural connect omics. |
A63.7230 Core Technology | | ◉ High Resolution High Brightness Electron Optical System 100M/s ultra high-speed imaging at 50KV. The system has video-level
(25fps@2k*2k) nanoscale analysis capability, allowing for fully
automated information acquisition without omissions while
maintaining high resolution. ◉ High Sensitivity Direct Electron Detector All detectors of A63.7230 use independently designed direct
electron detectors, which convert electrons directly into
electrical signals, achieving a detection efficiency of over 80%
and a higher signal-to-noise ratio (SNR). ◉ Rapid Switching Between Large Field and High-Resolution Imaging Innovative electron optical design allows large field imaging and
high-resolution imaging to operate independently, enabling rapid
switching, precise particle identification and positioning, and
quick high-resolution imaging. ◉ High Speed and High Stability Mechanical Motion Platform Uses a vibration-free motion platform, X=±4mm, Y=±4mm, positioning
accuracy 1um. |
| A63.7230 Transmission Scanning Electron Microscope (STEM) | | Resolution | 1.0nm@50kV | | (1nA beam current, under optimal conditions) | | Imaging Mode | BF/DF (Bright Field/Dark Field) | | STEM Mode Landing Voltage | 50KV | | Detector Type | Semiconductor Direct Detector | | Magnification | 1X-500X (Low Magnification Optical Imaging) | | 500X - 800,000X (STEM Images) | | Electron Gun | Schottky Type Thermal Field Emission | | Electron Beam Current | 50pA to 100nA | | Sample Stage | X=±4mm, Y=±4mm, Positioning Accuracy 1um | | Imaging Flux | Can complete imaging of a 1x1mm² area at 4nm pixel within 0.5 hours | | Ultra High-Speed Image Acquisition | 100MB/s, a single 24k x 24k image takes only 6.5s to capture | | Acquisition Method | STEM Bright Field (BF) or Dark Field (DF) Acquisition | | High Throughput Electron Microscope Control Software | Equipped with automatic image optimization, intelligent focus
tracking, panoramic optical navigation, and large area fully
automated acquisition functions | | Rapid Switching Between Large Field and High-Resolution Imaging | Innovative electron optical design, independent operation of large
field imaging and high-resolution imaging, rapid switching, precise
particle identification and positioning, rapid high-resolution
imaging | | Image Analysis Processing Software AI Server | Ultra-large field imaging, 100um@25nm, AI Server high efficiency
recognition and measurement | | High Throughput Particle Quantitative Detection Capability | Brand new sample loading system and automated sample management
system, ensuring quantitative detection |
▶ Optical System Designed for Fully Automated Micro Particle
Detection Traditional transmission electron microscopes have a small field of
view, which cannot meet the detection and identification needs of a
large number of nanoparticles. A63.7230 is designed based on
semiconductor industrial-grade electron beam detection equipment
concepts, achieving high-throughput nanoparticle detection
capabilities. A63.7230 achieves ultra high-speed imaging through innovative
designs such as fast imaging technology, vibration-free sample
stage, high-speed electron optical system, and AI technology, with
imaging speeds reaching dozens of times that of traditional
electron microscopes. |
▶ Fully Automated Design A series of actions such as power-on inspection, navigation
positioning, one-click centering, focus adjustment, and shift
correction are automated. The real-time focus tracking system is
composed of hardware and software. Using precise electronic
deflection to achieve accurate positioning of sample images,
resulting in high repeatability of results. It not only eliminates
the need for extensive effort to adjust and locate sample positions
but also utilizes AI intelligence for automatic detection,
ultimately achieving unattended continuous operation. |
▶ Customizable Software Functions for Different Clients Leveraging modern artificial intelligence, AI algorithms, etc., to
assist experimental personnel in analysis, from front-end sample
preparation to automatic full-section imaging and stitching by the
electron microscope, generating high-resolution maps, and then to
back-end data processing. AI intelligent analysis can be used for
automatic detection and classification of particles, providing
users with a complete solution. |
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