China Compound Optical Microscope manufacturer
Opto-Edu (Beijing) Co., Ltd.
Opto-Edu (Beijing) Co., Ltd.
13
Home > Products > Scanning Microscope >

Opto Edu A62.4510 Electron Probe Microscope , Spm Microscope Usb

Opto Edu A62.4510 Electron Probe Microscope , Spm Microscope Usb

Brand Name OPTO-EDU
Model Number A62.4510
Certification CE, Rohs
Place of Origin China
Minimum Order Quantity 1pc
Price FOB $1~1000, Depend on Order Quantity
Payment Terms L/C, T/T, Western Union
Supply Ability 5000 pcs/ Month
Delivery Time 5~20 Days
Packaging Details Carton Packing, For Export Transportation
Work Mode "Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode"
Current Spectrum Curve "RMS-Z Curve F-Z Force Curve"
XY Scan Mode "Probe Driven Scanning, Piezo Tube Scanner"
XY Scan Range 70×70um
XY Scan Resolution 0.2nm
Z Scan Range 5um
Z Scan Resolution 0.05nm
Scan Speed 0.6Hz~30Hz
Scan Angle 0~360°
Sample Weight ≤15Kg
Stage Size "Dia.100mm 【Optional】 Dia.200mm Dia.300mm"
Stage XY Moving " 100x100mm, Resolution 1um 【Optional】 200x200mm 300x300mm"
Stage Z Moving "15mm, Resolution 10nm 【Optional】 20mm 25mm"
Shock-Absorbing Design "Spring Suspension 【Optional】 Active Shock Absorber"
Optical System "Objective 5x 5.0M Digital Camera 【Optional】 Objective 10x Objective 20x"
Detailed Product Description

Probe Scanning Atomic Force Microscope

  • Gantry scanning head design, marble base, vacuum adsorption stage, sample size and weight are basically unlimited
  • Intelligent needle feeding method with automatic detection of motor-controlled piezoelectric ceramics to protect probes and samples
  • Automatic optical positioning, no need to adjust focus, real-time observation and positioning probe sample scanning area
  • Equipped with closed metal shield, pneumatic shock-absorbing table, strong anti-interference ability;
  • Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy is better than 98%
  •            ◆ The first commercial atomic force microscope in China that keeps the sample stationary and the probe moves and scans;

               ◆ The sample size and weight are almost unlimited, especially suitable for the detection of very large samples;

  •            ◆ The sample stage is highly expandable, which is very convenient for multi-instrument combination to realize in-situ detection;

               ◆ Electric control of sample moving table and lifting table, which can be programmed with multi-point position to realize fast automatic detection;

               ◆ Gantry scanning head design, marble base, vacuum adsorption and magnetic adsorption stage;

  •           ◆ The motor automatically controls the intelligent needle feeding method of the piezoelectric ceramic automatic detection to protect the probe and the sample;

  •           ◆ High magnification auxiliary optical microscope positioning, real-time observation and positioning of probe and sample scanning area;

  •           ◆ Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%.

  •  

  •  A62.4510A62.4511
    Work ModeContact Mode
    Tapping Mode

    【Optional】
    Friction Mode
    Phase Mode
    Magnetic Mode
    Electrostatic Mode
    Contact Mode
    Tapping Mode

    【Optional】
    Friction Mode
    Phase Mode
    Magnetic Mode
    Electrostatic Mode
    Current Spectrum CurveRMS-Z Curve
    F-Z Force Curve
    RMS-Z Curve
    F-Z Force Curve
    XY Scan ModeProbe Driven Scanning,
    Piezo Tube Scanner
    Sample Driven Scanning, Closed Loop Piezoelectric Shift Scanning Stage
    XY Scan Range70×70umClosed Loop 100×100um
    XY Scan Resolution0.2nmClosed Loop 0.5nm
    Z Scan Mode Probe Driven Scanning
    Z Scan Range5um5um
    Z Scan Resolution0.05nm0.05nm
    Scan Speed0.6Hz~30Hz0.6Hz~30Hz
    Scan Angle0~360°0~360°
    Sample Weight≤15Kg≤0.5Kg
    Stage SizeDia.100mm

    【Optional】
    Dia.200mm
    Dia.300mm
    Dia.100mm

    【Optional】
    Dia.200mm
    Dia.300mm
    Stage XY Moving100x100mm, Resolution 1um

    【Optional】
    200x200mm
    300x300mm
    100x100mm, Resolution 1um

    【Optional】
    200x200mm
    300x300mm
    Stage Z Moving15mm, Resolution 10nm
    【Optional】
    20mm
    25mm
    15mm, Resolution 10nm
    【Optional】
    20mm
    25mm
    Shock-Absorbing DesignSpring Suspension

    【Optional】
    Active Shock Absorber
    Spring Suspension

    【Optional】
    Active Shock Absorber
    Optical SystemObjective 5x
    5.0M Digital Camera

    【Optional】
    Objective 10x
    Objective 20x
    Objective 5x
    5.0M Digital Camera

    【Optional】
    Objective 10x
    Objective 20x
    OutputUSB2.0/3.0USB2.0/3.0
    SoftwareWin XP/7/8/10Win XP/7/8/10
    Main BodyGantry Scan Head, Marble BaseGantry Scan Head, Marble Base
  • MicroscopeOptical MicroscopeElectron MicroscopeScanning Probe Microscope
    Max Resolution (um)0.180.000110.00008
    RemarkOil immersion 1500xImaging diamond carbon atomsImaging high-order graphitic carbon atoms
     
  • Probe-Sample InteractionMeasure SignalInformation
    ForceElectrostatic ForceShape
    Tunnel CurrentCurrentShape, Conductivity
    Magnetic ForcePhaseMagnetic Structure
    Electrostatic ForcePhasecharge distribution
  •  ResolutionWorking ConditionWorking TemperationDamge to SampleInspection Depth
    SPMAtom Level 0.1nmNormal, Liquid, VacuumRoom or Low TemperationNone1~2 Atom Level
    TEMPoint 0.3~0.5nm
    Lattice 0.1~0.2nm
    High VaccumRoom TemperationSmallUsually <100nm
    SEM6-10nmHigh VaccumRoom TemperationSmall10mm @10x
    1um @10000x
    FIMAtom Level 0.1nmSuper High Vaccum30~80KDamgeAtom Thickness
  •  
  •  
  •  

Product Tags: opto edu electron probe microscope   usb electron probe microscope   opto edu spm microscope  
Related Products
Email to this supplier
 
From:
Enter your Email please.
To: Opto-Edu (Beijing) Co., Ltd.
Subject:
Message:
Characters Remaining: (80/3000)