Probe Scanning Atomic Force Microscope- Gantry scanning head design, marble base, vacuum adsorption stage,
sample size and weight are basically unlimited
- Intelligent needle feeding method with automatic detection of
motor-controlled piezoelectric ceramics to protect probes and
samples
- Automatic optical positioning, no need to adjust focus, real-time
observation and positioning probe sample scanning area
- Equipped with closed metal shield, pneumatic shock-absorbing table,
strong anti-interference ability;
- Integrated scanner nonlinear correction user editor, nanometer
characterization and measurement accuracy is better than 98%
◆ The first commercial
atomic force microscope in China that keeps the sample stationary
and the probe moves and scans; ◆ The sample size and
weight are almost unlimited, especially suitable for the detection
of very large samples; ◆ The sample stage is
highly expandable, which is very convenient for multi-instrument
combination to realize in-situ detection; ◆ Electric control of
sample moving table and lifting table, which can be programmed with
multi-point position to realize fast automatic detection; ◆ Gantry scanning head
design, marble base, vacuum adsorption and magnetic adsorption
stage; ◆ The motor automatically
controls the intelligent needle feeding method of the piezoelectric
ceramic automatic detection to protect the probe and the sample; ◆ High magnification auxiliary
optical microscope positioning, real-time observation and
positioning of probe and sample scanning area; ◆ Integrated scanner nonlinear
correction user editor, nanometer characterization and measurement
accuracy better than 98%. | A62.4510 | A62.4511 | Work Mode | Contact Mode Tapping Mode
【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode | Contact Mode Tapping Mode
【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode | Current Spectrum Curve | RMS-Z Curve F-Z Force Curve | RMS-Z Curve F-Z Force Curve | XY Scan Mode | Probe Driven Scanning, Piezo Tube Scanner | Sample Driven Scanning, Closed Loop Piezoelectric Shift Scanning
Stage | XY Scan Range | 70×70um | Closed Loop 100×100um | XY Scan Resolution | 0.2nm | Closed Loop 0.5nm | Z Scan Mode | | Probe Driven Scanning | Z Scan Range | 5um | 5um | Z Scan Resolution | 0.05nm | 0.05nm | Scan Speed | 0.6Hz~30Hz | 0.6Hz~30Hz | Scan Angle | 0~360° | 0~360° | Sample Weight | ≤15Kg | ≤0.5Kg | Stage Size | Dia.100mm
【Optional】 Dia.200mm Dia.300mm | Dia.100mm
【Optional】 Dia.200mm Dia.300mm | Stage XY Moving | 100x100mm, Resolution 1um
【Optional】 200x200mm 300x300mm | 100x100mm, Resolution 1um
【Optional】 200x200mm 300x300mm | Stage Z Moving | 15mm, Resolution 10nm 【Optional】 20mm 25mm | 15mm, Resolution 10nm 【Optional】 20mm 25mm | Shock-Absorbing Design | Spring Suspension
【Optional】 Active Shock Absorber | Spring Suspension
【Optional】 Active Shock Absorber | Optical System | Objective 5x 5.0M Digital Camera
【Optional】 Objective 10x Objective 20x | Objective 5x 5.0M Digital Camera
【Optional】 Objective 10x Objective 20x | Output | USB2.0/3.0 | USB2.0/3.0 | Software | Win XP/7/8/10 | Win XP/7/8/10 | Main Body | Gantry Scan Head, Marble Base | Gantry Scan Head, Marble Base |
Microscope | Optical Microscope | Electron Microscope | Scanning Probe Microscope | Max Resolution (um) | 0.18 | 0.00011 | 0.00008 | Remark | Oil immersion 1500x | Imaging diamond carbon atoms | Imaging high-order graphitic carbon atoms | | | |
Probe-Sample Interaction | Measure Signal | Information | Force | Electrostatic Force | Shape | Tunnel Current | Current | Shape, Conductivity | Magnetic Force | Phase | Magnetic Structure | Electrostatic Force | Phase | charge distribution |
| Resolution | Working Condition | Working Temperation | Damge to Sample | Inspection Depth | SPM | Atom Level 0.1nm | Normal, Liquid, Vacuum | Room or Low Temperation | None | 1~2 Atom Level | TEM | Point 0.3~0.5nm Lattice 0.1~0.2nm | High Vaccum | Room Temperation | Small | Usually <100nm | SEM | 6-10nm | High Vaccum | Room Temperation | Small | 10mm @10x 1um @10000x | FIM | Atom Level 0.1nm | Super High Vaccum | 30~80K | Damge | Atom Thickness |
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