Basic Level Atomic Force Microscope- Basic Level, Separate controller & main body design, with
Contact Mode, Tapping Mode, 4x Objective
- The scanning probe and the sample stage are integrated, and the
anti-interference ability is strong
- 2. Precision laser and probe positioning device, it is simple and
convenient to replace the probe and adjust the spot;
- 4X objective lens optical positioning, no need to focus, real-time
observation and positioning of the probe sample scanning area
- The spring suspension shockproof method is simple and practical,
and has strong anti-interference ability
◆ The laser detection head
and the sample scanning stage are integrated, the structure is very
stable, and the anti-interference is strong ◆ Precision probe
positioning device, laser spot alignment adjustment is very easy ◆ The single-axis drive
sample automatically approaches the probe vertically, so that the
needle tip is perpendicular to the sample scan ◆ The intelligent needle
feeding method of motor-controlled pressurized piezoelectric
ceramic automatic detection protects the probe and the sample ◆ Automatic optical
positioning, no need to focus, real-time observation and
positioning of the probe sample scanning area ◆ Spring suspension
shockproof method, simple and practical, good shockproof effect ◆ Metal shielded
soundproof box, built-in high-precision temperature and humidity
sensor, real-time monitoring of the working environment ◆ Integrated scanner
nonlinear correction user editor, nanometer characterization and
measurement accuracy better than 98% Specification | A62.4500 | A622.4501 | A62.4503 | A62.4505 | Work Mode | Tapping Mode
【Optional】 Contact Mode Friction Mode Phase Mode Magnetic Mode Electrostatic Mode | Contact Mode Tapping Mode
【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode | Contact Mode Tapping Mode
【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode | Contact Mode Tapping Mode
【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode | Current Spectrum Curve | RMS-Z Curve
【Optional】 F-Z Force Curve | RMS-Z Curve F-Z Force Curve | RMS-Z Curve F-Z Force Curve | RMS-Z Curve F-Z Force Curve | XY Scan Range | 20×20um | 20×20um | 50×50um | 50×50um | XY Scan Resolution | 0.2nm | 0.2nm | 0.2nm | 0.2nm | Z Scan Range | 2.5um | 2.5um | 5um | 5um | Y Scan Resolution | 0.05nm | 0.05nm | 0.05nm | 0.05nm | Scan Speed | 0.6Hz~30Hz | 0.6Hz~30Hz | 0.6Hz~30Hz | 0.6Hz~30Hz | Scan Angle | 0~360° | 0~360° | 0~360° | 0~360° | Sample Size | Φ≤90mm H≤20mm | Φ≤90mm H≤20mm | Φ≤90mm H≤20mm | Φ≤90mm H≤20mm | XY Stage Moving | 15×15mm | 15×15mm | 25×25um | 25×25um | Shock-Absorbing Design | Spring Suspension | Spring Suspension Metal Shielding Box | Spring Suspension Metal Shielding Box | - | Optical Syestem | 4x Objective Resolution 2.5um | 4x Objective Resolution 2.5um | 10x Objective Resolution 1um | Eyepiece 10x Infinity Plan LWD APO 5x10x20x50x 5.0M Digital Camera 10" LCD Monitor, With Measuring LED Kohler Illumination Coaxial Coarse & Fine Focusing | Output | USB2.0/3.0 | USB2.0/3.0 | USB2.0/3.0 | USB2.0/3.0 | Software | Win XP/7/8/10 | Win XP/7/8/10 | Win XP/7/8/10 | Win XP/7/8/10 |
Microscope | Optical Microscope | Electron Microscope | Scanning Probe Microscope | Max Resolution (um) | 0.18 | 0.00011 | 0.00008 | Remark | Oil immersion 1500x | Imaging diamond carbon atoms | Imaging high-order graphitic carbon atoms | | | |
Probe-Sample Interaction | Measure Signal | Information | Force | Electrostatic Force | Shape | Tunnel Current | Current | Shape, Conductivity | Magnetic Force | Phase | Magnetic Structure | Electrostatic Force | Phase | charge distribution |
| Resolution | Working Condition | Working Temperation | Damge to Sample | Inspection Depth | SPM | Atom Level 0.1nm | Normal, Liquid, Vacuum | Room or Low Temperation | None | 1~2 Atom Level | TEM | Point 0.3~0.5nm Lattice 0.1~0.2nm | High Vaccum | Room Temperation | Small | Usually <100nm | SEM | 6-10nm | High Vaccum | Room Temperation | Small | 10mm @10x 1um @10000x | FIM | Atom Level 0.1nm | Super High Vaccum | 30~80K | Damge | Atom Thickness |
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