Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode
|
Scanning Tunneling Microscope◆ Miniaturized and detachable design, very easy to carry and classroom teaching
◆ The detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong
◆ The single-axis drive sample automatically approaches the probe vertically, so that the needle tip is perpendicular to the sample scan
◆ The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample
◆ Side CCD observation system, real-time observation of the probe needle insertion state and positioning of the probe sample scanning area
◆ Spring suspension shockproof method, simple and practical, good shockproof effect
◆ Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%
|
||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
Product Tags: opto edu scanning tunneling electron microscope constant height scanning tunneling electron microscope current mode opto edu microscope |
![]() |
6x~1000000x Scanning Optical Microscope Digital Five Axis Motorized Stage |
![]() |
OPTO-EDU A63.7005 Schottky Field Emission Scanning Electron Microscope SE BSE 100000x 2.5nm@20KV |
![]() |
OPTO-EDU A63.7004 Single-Crystal Filament Scanning Electron Microscope SE BSE 360000x 3nm@20KV |
![]() |
OPTO-EDU A63.7003 Tungsten Filament Scanning Electron Microscope SE BSE 360000x 4nm@20KV |
![]() |
OPTO-EDU A63.7002 Tungsten Filament Scanning Electron Microscope SE BSE 200000x 6nm@18KV(SE) |
![]() |
OPTO-EDU A63.7001 Tungsten Filament Scanning Electron Microscope SE BSE 150000x 10nm@15KV |